RMS VISION SYSTEMS      Data Storage

 HOME 

PRODUCTS

CONTACT

RMS Vision Systems Inc. Moorpark, CA USA | TEL 805-222-5430

 

Data Storage

 

An increase in disk drive capacity demand (laptops, iPods, video game consoles, movie storage, etc) has pushed the industry to automate quality control to handle the higher volume. One of the hardest areas in the past has been the inspection of the disk drive head (slider). Due to its shrinking size and complex features this has been an area where the inspection has been done manually, requiring rows of operators manning microscopes to view the slider.  RMS has developed a system that can inspect the three critical areas of the slider: the Air Bearing Surface (ABS), the Alumina area (including the Pole Tip) and the Depo area (containing the contact pads for test and operation). Built upon the standard Defect Detection package this custom system combines thorough inspection with high speed. 

 

Automatic Defect Inspection

Air Bearing Surface

Alumina Area/ Pole Tip

Depo Side

 

Chipping, Cracking & other edge defects

 

Contamination, Stains, scratches, Pits Voids & other surface defects

 

Embedded metal

 

Masking defects

 

Part measurements ( width, height, pattern offset, etc)

 

 

Chipping, Cracking & other edge defects

 

Contamination, Stains, Scratches, Pits Voids & other surface defects

 

Critical Zone defects (Pole Tip, ELG Box, etc.)

 

Embedded metal

 

Masking defects

 

 

Probe Mark/ Wire Bond defects

 

Defects caused by Delamination, Deposition, Masking, Etching, Cutting, Milling, etc.

 

Chipping, Cracking & other edge defects

 

Contamination, Stains, Scratches, Pits & other surface defects

 

Critical Zone defects (Coil, etc.)

 

System Capability 

  • Automatic Defect Detection, Classification & Dimensional Metrology

  • Very high color imaging resolution with full color processing/ recognition

  • Production UPH: 3600, 6000 & 12000 models

  • Multi-Part Tray Loading

  • High Accuracy OCR

  • Full compatibility/ Integration with Sorter

  • Offline Defect Review with Image Archival

  • Fully compatible configurations for Wafer Level, Bar Level & Slider Level in Waffle Pack/ Wash Tray

 

   

Copyrights © 2009, RMS Vision Systems, Inc.  All rights reserved.